The Joseph W. Ozier η Eta Award is given specifically to recognize the presenter or presenters whose presentation demonstrates how new or refined test techniques, imaginative data collection and processing, novel approaches, more efficient support equipment, fixtures, etc. resulted in better execution of the test program, balanced with risk and mindful of safety as well as lessons learned that increase test efficiency and effectiveness. In today’s world, fiscal realities and limitations present unique challenges to testers to plan, execute and report a safe and technically sound test program in an efficient manner to minimize cost.
The Joseph W. Ozier η Eta Award will be presented each year at the Annual Symposium and Awards Banquet. The President of the Society or his/her designee and the sponsoring company, Lockheed Martin, will present this Award.
The Award consists of a small plaque and a cash honorarium, the amount to be approved by the Board of Directors and Lockheed Martin.
The name of the recipient(s) of the Joseph W. Ozier η Eta Award will be treated as confidential information. Notification of this selection will be made known to the winner(s) only if it becomes necessary to ascertain that he/she will be present to accept the award.
The same panel of judges used for the Tenhoff Award selection will be used for the Joseph W. Ozier η Eta Award. The grade sheet utilized by the judges is available HERE.